Energy response characterization of InGaP X-ray detectors

Synthesis and characterization of Gd2O2 S: Tb3+ phosphor powder for X-ray imaging detectors

Gadolinium oxysulfide phosphor doped with trivalent terbium have been synthesized using urea homogenous precipitation and followed by sulfurization at 800 °C under argon atmosphere. Structural and morphological of synthesized phosphor powder were characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM) and Fourier transform infrared spectrometry (FT-IR). Hexagonal structure ...

Characterization of X-ray area detectors for synchrotron beamlines.

In order to deal with the problem of quantitative and consistent evaluation of two-dimensional X-ray detectors at synchrotron beamlines, the methodology for X-ray area detector characterization is reviewed. It is based on the definition of a minimum yet complete set of imaging parameters able to describe any kind of two-dimensional detector regardless of its operating range, field of applicatio...

X-ray imaging detectors

The X-ray Response of Silicon Drift Detectors

A new discrete analytic calculation of the spectral response of silicon drift detectors for X-rays is developed and compared with measurements using monochromatic synchrotron radiation in the 0.2 to 1.9 keV energy range in order to explain the observed background. The calculations are in good agreement with the measurements for secondary electron charge cloud widths σsec of (85±7) nm below and ...

X-Ray Data Booklet Section 4.5 X-RAY DETECTORS

A wide variety of x-ray detectors is available, some counting single photons, some providing only measurements of count rate or total flux, others measuring the energy, position, and/or incidence time of each x-ray. Table 4-2 provides typical values for useful energy range, energy resolution, dead time per event, and maximum count rate capability for common x-ray detectors. For special applicat...